Tabletop extreme ultraviolet reflectometer for quantitative nanoscale reflectometry, scatterometry, and imaging
Author | |
---|---|
Abstract |
Imaging using coherent extreme-ultraviolet (EUV) light provides exceptional capabilities for the characterization of the composition and geometry of nanostructures by probing with high spatial resolution and elemental specificity. We present a multi-modal tabletop EUV imaging reflectometer for high-fidelity metrology of nanostructures. The reflectometer is capable of measurements in three distinct modes: intensity reflectometry, scatterometry, and imaging reflectometry, where each mode addresses different nanostructure characterization challenges. |
Year of Publication |
2023
|
Journal Title |
Review of Scientific Instruments
|
Volume |
94
|
Issue |
12
|
ISSN Number |
0034-6748, 1089-7623
|
DOI | |
Download citation | |
JILA PI | |
Journal Article
|
|
JILA Topics | |
Publication Status |