Yuka Esashi

First name
Yuka
Last name
Esashi
Esashi Y., N.W. Jenkins, Y. Shao, J.M. Shaw, S. Park, M. Murnane, H. Kapteyn, and M. Tanksalvala, Review Of Scientific Instruments 94, (2023).
Wang B., N.J. Brooks, P. Johnsen, N.W. Jenkins, Y. Esashi, I. Binnie, M. Tanksalvala, H. Kapteyn, and M. Murnane, Optica 10, 1245 (2023).
Esashi Y., N.W. Jenkins, Y. Shao, J.M. Shaw, S. Park, M. Murnane, H. Kapteyn, and M. Tanksalvala, Review Of Scientific Instruments (In Press) (2023).
Wang B., N. Brooks, P. Johnsen, N.W. Jenkins, Y. Esashi, I. Binnie, M. Tanksalvala, H. Kapteyn, and M. Murnane, Optics & Photonics News (In Press) (2023).
McBennett B., A. Beardo, E.E. Nelson, B. Abad, T. Frazer, A. Adak, Y. Esashi, B. Li, H. Kapteyn, M. Murnane, and J.L. Knobloch, Nano Letters 23, 2129-2136 (2023).
Jacobs M., Y. Esashi, N.W. Jenkins, N. Brooks, H. Kapteyn, M. Murnane, and M. Tanksalvala, Optics Express 30, 27967 (2022).
Brooks N., B. Wang, I. Binnie, M. Tanksalvala, Y. Esashi, J.L. Knobloch, Q.L. Nguyen, B. McBennett, N.W. Jenkins, G. Gui, and Z.Z.T. University, Optics Express 30, 30331 (2022).
Esashi Y., M. Tanksalvala, Z. Zhang, N.W. Jenkins, H. Kapteyn, and M. Murnane, Osa Continuum 4, 1497 (2021).
Wang B., M. Tanksalvala, Z. Zhang, Y. Esashi, N.W. Jenkins, M. Murnane, H. Kapteyn, and C.-T. Liao, Metrology, Inspection, And Process Control For Semiconductor Manufacturing Xxxv 11611, 76-90 (2021).
Tanksalvala M., C.L. Porter, Y. Esashi, B. Wang, N.W. Jenkins, Z. Zhang, G.P. Miley, J.L. Knobloch, B. McBennett, N. Horiguchi, and S. Yazdi, Science Advances 7, eabd9667 (2021).