Wang B., N. Brooks, P. Johnsen, N.W. Jenkins, Y. Esashi, I. Binnie, M. Tanksalvala, H. Kapteyn, and M. Murnane, Optics & Photonics News (In Press)(2023).
McBennett B., A. Beardo, E.E. Nelson, B. Abad, T. Frazer, A. Adak, Y. Esashi, B. Li, H. Kapteyn, M. Murnane, and J.L. Knobloch, Nano Letters23, 2129-2136(2023).
Brooks N., B. Wang, I. Binnie, M. Tanksalvala, Y. Esashi, J.L. Knobloch, Q.L. Nguyen, B. McBennett, N.W. Jenkins, G. Gui, and Z.Z.T. University, Optics Express30, 30331(2022).
Wang B., M. Tanksalvala, Z. Zhang, Y. Esashi, N.W. Jenkins, M. Murnane, H. Kapteyn, and C.-T. Liao, Metrology, Inspection, And Process Control For Semiconductor Manufacturing Xxxv11611, 76-90(2021).
Tanksalvala M., C.L. Porter, Y. Esashi, B. Wang, N.W. Jenkins, Z. Zhang, G.P. Miley, J.L. Knobloch, B. McBennett, N. Horiguchi, and S. Yazdi, Science Advances7, eabd9667(2021).