A new metrology technique for defect inspection via coherent Fourier scatterometry using orbital angular momentum beams
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Abstract |
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Year of Conference |
2021
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Conference Name |
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV
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Volume |
11611
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Start Page or Article ID |
76-90
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Date Published |
2021-02
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Publisher |
SPIE
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URL |
https://doi.org/10.1117/12.2584728
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DOI |
10.1117/12.2584728
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Conference Proceedings
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