Shen Y., Q. Zhan, L.G. Wright, D.N. Christodoulides, F.W. Wise, A.E. Willner, K.-heng Zou, Z. Zhao, M.A. Porras, A. Chong, and C. Wan, Journal Of Optics25, 093001(2023).
Rana A., C.-T. Liao, E. Iacocca, J. Zou, M. Pham, X. Lu, E.-E. Subramanian, Y.H. Lo, S. Ryan, C.S. Bevis, and R.M. Karl, Nature Nanotechnology18, 227(2023).
Gentry C., C.-T. Liao, W. You, S. Ryan, B.A. Varner, X. Shi, M. Guan, T. Gray, D. Temple, S. Meng, and M.B. Raschke, Scientific Reports12, 19734(2022).
Wang B., M. Tanksalvala, Z. Zhang, Y. Esashi, N.W. Jenkins, M. Murnane, H. Kapteyn, and C.-T. Liao, Metrology, Inspection, And Process Control For Semiconductor Manufacturing Xxxv11611, 76-90(2021).
Tanksalvala M., C.L. Porter, Y. Esashi, B. Wang, N.W. Jenkins, Z. Zhang, G.P. Miley, J.L. Knobloch, B. McBennett, N. Horiguchi, and S. Yazdi, Science Advances7, eabd9667(2021).