Si/SiO2 interface roughness: Comparison between surface second harmonic generation and x-ray scattering
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Year of Publication |
1997
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Date Published |
Jan-01-1997
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Journal Title |
Applied Physics Letters
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Volume |
70
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Start Page or Article ID |
1414
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ISSN Number |
00036951
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DOI | |
URL | |
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JILA PI | |
Journal Article
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Publication Status |