@article{6457,
  author = {Steven Cundiff and W. Knox and F. Baumann and K. Evans-Lutterodt and M.-T. Tang and M. Green and H. van Driel},
  title = {Si/SiO2 interface roughness: Comparison between surface second harmonic generation and x-ray scattering},
  year = {1997},
  journal = {Applied Physics Letters},
  volume = {70},
  pages = {1414},
  month = {Jan-01-1997},
  issn = {00036951},
  url = {http://link.aip.org/link/APPLAB/v70/i11/p1414/s1\&Agg=doi},
  doi = {10.1063/1.118592},
}