TY - JOUR
AU - Steven Cundiff
AU - W. Knox
AU - F. Baumann
AU - K. Evans-Lutterodt
AU - M.-T. Tang
AU - M. Green
AU - H. van Driel
BT - Applied Physics Letters
DA - Jan-01-1997
DO - 10.1063/1.118592
PY - 1997
EP - 1414
T2 - Applied Physics Letters
TI - Si/SiO2 interface roughness: Comparison between surface second harmonic generation and x-ray scattering
UR - http://link.aip.org/link/APPLAB/v70/i11/p1414/s1\&Agg=doi
VL - 70
SN - 00036951
ER -