Quantitative tabletop coherent diffraction imaging microscope for EUV lithography mask inspection
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Year of Publication |
2014
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Conference Name |
unknown
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Date Published |
2014-01
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Publisher |
SPIE
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Conference Location |
San Jose, California, USA
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URL |
http://proceedings.spiedigitallibrary.org/proceeding.aspx?doi=10.1117/12.2046526
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DOI |
10.1117/12.2046526
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