Analysis of trace impurities in semiconductor gas via~cavity-enhanced direct frequency comb spectroscopy
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Year of Publication |
2010
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Date Published |
2010-09
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Journal Title |
Applied Physics B
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Volume |
100
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Start Page or Article ID |
917-924
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ISSN Number |
0946-2171
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DOI | |
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JILA PI | |
Journal Article
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