Two ions in one trap: ultra-high precision mass spectrometry?

Author
Year of Publication
2003
Conference Name
unknown
Date Published
2003-01
Publisher
IEEE
Conference Location
Ottawa, Ont., Canada
URL
http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=1034849
DOI
10.1109/CPEM.2002.1034849
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