TY - JOUR
AU - M. Eickhoff
AU - John Hall
BT - IEEE Transactions on Instrumentation and Measurement
DA - Jan-04-1995
DO - 10.1109/19.377797
PY - 1995
SP - 155
EP - 158
T2 - IEEE Transactions on Instrumentation and Measurement
TI - Optical frequency standard at 532 nm
VL - 44
SN - 00189456
ER -